Applications
The NanoR™ with the Crystal Scanner™ can measure topography images of all types of samples including technical samples and high-resolution imaging. Technical samples include DVD bits, microlens, paper, gratings, and patterned wafers. High-resolution images of nanostructures such as grains, nanoparticles, nanocrystals, and nanotubes are easily imaged.  High-resolution CFM topography image of magnetic tape. Nanoparticles with diameters of 10 nm are visualized here.  CFM of a test pattern fabricated with electron beam lithography.  CFM image of a piece of commercially available plastic.  Structures at the surface of a patterned wafer imaged with the CFM. 
Atomic terraces of Si imaged with the CFM(Left) Histogram showing single steps.
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