The force sensor in the Crystal Scanner™ is a small crystal oscillator that has a sharp probe mounted at the end of the crystal. When the probe approaches a surface, the oscillations of the probe are dampened. The amount of dampening is dependent on the force between probe and sample. Software is used to optimize the oscillation frequency and the amount of force between the probe and sample while scanning. No mechanical adjustments are required for the crystal sensor used in the Crystal Scanner™.
A quartz cross crystal is used in the Nano-R™ Crystal for tracking the forces on a sample. A probe is mounted at one end of the arm of one of the crystals.
Crystal sensor mounted on the zero insertion force module that is used in the Crystal Scanner™.
3350 Scott Blvd. #29, Santa Clara, CA 95054
Phone: 1-800-246-3704 Direct: 408-982-9492 Fax: 408-982-9151
