Crystal Scanner

The traditional atomic force microscope uses a light lever for measuring the force of the probe on the surface. Although the light lever is complex and requires alignment for its operation, there are some advantages. The primary advantage is the ability to do material sensing modes such as lateral force microscopy, phase imaging and filed measurements such as magnetic force microscopy and electrical force microscopy (EFM).

The Nano-RT stage continues to be compatible with the Light Lever Sensor. Changing between the light lever sensor and the crystal sensor takes only a few minutes.