Introduction
The Crystal Scanner™ is an exciting new option for the Pacific Nanotechnology products. With the Crystal Scanner™, imaging nanostructures does not require an expert in the field of scanning probe microscopy. At the core of the Crystal Scanner™ is a new type of force sensor that does not require a complex alignment procedure. It is capable of nanostructure visualization and metrology applications.
With the Nano-R™ fitted with a Crystal Scanner™, engineers and scientists do not have to wait to get the nanoscale images that they require. They can directly measure the images themselves. Companies and research institutions do not have to hire an AFM expert so it costs much less to do nanotechnology research, development and process control.
The Crystal Scanner™ incorporates substantial new developments in the areas of nanonewton force measurements. A Crystal Scanner™ in combination with the stage and software automation in the Nano-R™, creates a new generation of user friendly nanoscale imaging instrumentation. Specifically, the NanoR™ in combination with our Point & Scan Technology™ provides great simplicity of operation.
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