Point & Scan Technology™ greatly reduces the complexity of the traditional scanning probe microscope. To measure an image, the operator simply launches the system software, and follows the instructions on the computer screen. After only a few steps, an operator is actually seeing an image appear on a computer screen.
Point & Scan Technology™ uses a standard procedure for doing the primary steps that are necessary for measuring nanoscale images. The steps are:
- Select the sample type for imaging.
- Place the sample in the microscope.
- Replace the crystal sensor if necessary.
- Locate the region on the sample for scanning.
- Measure an image.
This same procedure is followed for measuring technical samples such as DVD bits and semiconductor device structures as well as for measuring high-resolution images of nanostructures such as nanotubes, nanoparticles and nanocrystals.
Point & Scan Technology™ is possible because of advances in three fields; the crystal sensor, stage automation, and advanced software.
