Several advanced AFM techniques are possible with the Lithography, Probing, Move & Scan Software (LPM) package for
the Nano-R™ and Nano-I™ AFM. This product includes the software and hardware for making advanced measurements.
The advanced functions include:
Modifications: Basic shapes such as lines, dots, and circles as well as images from bitmaps may be written on a surface.
The writing technique may be potential, or force driven.
Probing: With the probing option of the LPM Software, it is possible to place the probe at a specific location on a surface
and make an electrical measurement. The initial capability for probing is I/V measurements. However, additional electrical
measurements are easily added.
Move-n-Scan: On the Nano-R™ AFM systems, many images may be imaged in sequence. The locations for measuring each
of the images are selected using a software interface.
Manipulation: Nano-scale objects may be moved across a surface with the AFM probe using the manipulation capability
of the LPM software. Examples include moving nano-spheres and nanotubes.
Drawing Nano-scale patterns is possible with LPM software. Patterns may be directly drawn with the software or imported
from a drawing file. After a pattern is loaded, the lithography method is designated and the LPM software does the rest.
Pacific Nanotechnology products are ideal for nano-lithography applications. Calibration sensors in the x and y axis facilitate
exact positioning of the probe and allow the creation of accurate nano-lithography patterns. Also, the high thermal stability
of the Pacific Nanotechnology SPM stages helps create accurate nano-lithography patterns.
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